Mr. Ayush Raina

Aayush Raina brings nearly 14 years of experience at Applied Materials, spanning algorithm development and application design across all three pillars of process control: inspection, review, and metrology. He has worked on flagship solutions including active-learning-based defect filtering for optical inspection tools, automatic defect detection, and auto-classification. He currently serves as Deputy Director of the Algorithm Group for the eBeam Metrology domain, leading the team responsible for critical dimension (CD), overlay, and other 2D/3D measurement capabilities